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Pulse group immunity test is to simulate the interference of many mechanical switches in the power grid when switching inductive loads. Such interference is characterized by narrow pulses appearing in groups, high repetition rate of pulses (KHZ-mhz level), steep rising edge (NS level), short duration of a single pulse (10-100NS level) and amplitude up to kV level. A cluster of narrow pulses can charge the junction capacitance of LED lighting devices, and when the energy accumulates to a certain extent, it can cause circuit or equipment errors. During the test, the pulses were superimposed on the power line (through the coupling/decoupling network) and the communication line (through the capacitive coupling clamp) to interfere with the equipment.
The test part of the EUT mainly includes the power supply port, protective grounding (PE), signal and control port.